Measurement & Testing
| Fri 10 May 2024
Seoul, May 11 -- Naver Corp has sought patent for method and system for detecting application malfunction. This invention was developed by Lee Young Gon, Ju Jeongin, Jeong Jaeboo, Nam Kyungwan, Lee Yubi, Kwon Byungchang, Kim Donghyun, Ha Hun Jin, You Seunghyun, Kim Jinwoong, Lee Sangkeun and Yoon Seokchan.
The patent applicat..