Measurement & Testing
| Mon 03 Aug 2026
Alexandria, Aug. 3 -- Inziv Ltd has applied United States patent for Fast Inspection of Device Under Test. Greserman Alexander, Ignatov Andrey, Lewis David Judah, Cohen Eyal, Maayan Eran, Huang Baoting, Yohai Yuval, Dadoosh Ori, Krol Alexander and Dekhter Rina developed it.
The patent application number is US202419157955 2024..