Measurement & Testing
| Tue 20 Jan 2026
Beijing, Jan. 21 -- Shandong Polytechnic has applied Chinese patent for Integrated Track Defect Detection Equipment and Method. Zheng Yueran, Bi Xinle, Wang Xin, Ji Yuancheng, Cao Zeyuan, Wang Xiaoqian, Ma Jinwang, Xiang Jianbo, Yin Qingduo, Pang Jiwei and Li Zhenlin developed it.
The patent application number is CN202510485215..