Measurement & Testing
| Wed 10 Jun 2026
Beijing, June 11 -- Shenzhen Nanrui Tech Co Ltd has filed a patent application for X-ray Flaw Detection System and Detection Method for Strain Clamp. This invention was developed by Huang Zhenjie, Li Hui, Hao Houtang, Yuan Fei, Li Yanxin, He Mingchun, Liu Xiaoming, Wang Wenzheng, Hao Yongqi, Xie Yonglin, Zhong Liangmin, Peng Yi,..