Optics & Imaging
| Fri 18 Sep 2026
Alexandria, Sept. 17 -- Koninklijke Philips has submitted a patent application for X-ray Imaging System Failure Detection Apparatus. This invention was developed by Schienagel Ina, Forthmann Peter, Ribbing Carolina Maria, Vogtmeier Gereon, Weiss Steffen, Douglas Alexander Ulrich, Leussler Christoph Günther, Lips Oliver and Kahl..