Semiconductor
| Fri 24 Jul 2026
Beijing, July 24 -- China Institute For Radiation Protection has applied Chinese patent for Test System and Method for Evaluating Ionization Irradiation Damage of Silicon-based Avalanche Photodiode. Liu Zhaoxing, Liu Liye, Yang Biao, Li Hua, Chen Faguo, Jin Haijing, Guo Rong, Liang Runcheng, Liu Xin, Zhao Ri, Zhang Jing and Han ..