Semiconductor
| Sat 07 Mar 2026
Beijing, March 7 -- Zhejiang University has submitted a patent application for Semiconductor Device Critical Breakdown Characteristic Simulation Method Based on Hybrid Finite Volume Method. Wang Qichao, Zhao Dongyan, Yin Wenyan, Chen Yanning, Liu Fang, Zhang Nianen, Yang Young-jong, Wang Yinda, Zhu Yaxing, Li Tanyi, Du Zhengwei ..