Semiconductor
| Wed 29 Jul 2026
Alexandria, July 30 -- U.S. Patent and Trademark Office has awarded a patent to Samsung Electronics for Method for Predicting Defect in Semiconductor Device. Jeon Joohyun, Park Chulwoo, Kim Sungjin, Roh Wonki, Byeon Seongjae, Lee Sangwoon, Jung Hyoeun, Kim Seunghyun and An Taeyoon developed the invention.
The patent application..