Measurement & Testing
| Thu 24 Sep 2026
Beijing, Sept. 24 -- State Intellectual Property Office of China has awarded a patent to Zhuhai Xinshijie Semiconductor Tech Co Ltd for Chip Testing Device. Fu Youliang, Kong Xiaolin, Wang Jian, Ou Gang, Deng Haijun, Chen Zhixiang and Yun Xing developed the invention.
The patent application number is CN202422893776U 20241126...